宇航学报 ›› 2012, Vol. 33 ›› Issue (8): 1112-1118.doi: 10.3873/j.issn.1000-1328.2012.08.016
姜丽敏1,2,3, 陈曙暄4, 向茂生1
JIANG Li
1. National Key Laboratory of Science and Technology on Microwave Imaging, Institute of Electronic,
Chinese Academy of Science,Beijing 100190,China;
2. Graduate University of Chinese Academy of Sciences,Beijing 100190,China;
3. Beijing Electrical and Mechanical Institute, Beijing 100074, China;
4. Beijing Aerospace Automatic Control Institute, Beijing 100854,China