Journal of Astronautics ›› 2012, Vol. 33 ›› Issue (6): 836-842.doi: 10.3873/j.issn.1000-1328.2012.06.022

• Environment Test&Device • Previous Articles     Next Articles

Experimental Study of Single Event Effects in SRAM-Based FPGA

SONG Ning-fang, ZHU Ming-da, PAN Xiong   

  1. Institute of Optics and Electronics, Beihang University,Beijing 100191,China
  • Received:2011-03-21 Revised:2011-07-21 Online:2012-06-15 Published:2012-06-21

Abstract: Single Event Effect (SEE) characteristics of military SRAM-based FPGA are studied using a heavy-ion test facility. The device evaluated is a 1,000,000 gate Virtex-II reprogrammable FPGA (XQ2V1000) from Xilinx. Details of single event upset are studied in both static and dynamic operating conditions to be able to understand the upset sensitivity. And test of single event functional interrupt is done to develop mitigation strategies based on reconfiguration technique. The FPGA evaluated is sensitive to single event upset and functional interrupt, but it is immune to single event latch-up up to an LET of 42MeV·cm 2/mg. In this paper, the upset sensitivity, detection and mitigation techniques are discussed; and the results indicate that the SRAM-based FPGA is good for space applications based on the reconfiguration technique.

Key words: SEE, FPGA, Heavy-ion, Reconfiguration, Radiation