Abstract:

The SEU detectors on some MEO and IGSO satellites are used to detect the single event upset (SEU) of the configuration memory of XQR2V3000 FPGA. The method based on the statistical number of reset to detect SEU is introduced. The statistical number of SEU of the configuration memory of the two MEO satellites and an IGSO satellite are given during the quiet periods of the solar activity in 2016 and during the solar flares burst on September 6, 2017. The spatial distribution of SEU is got according to the orbital elements. The results show that, in the quiet periods of the solar activity, the equivalent aluminum shielding thickness of the equipment is 6mm, the SEU rates of the configuration memory of FPGA in MEO and IGSO are respectively 0.513 upsets/(device·d) and 0.491 upsets/(device·d), about 22.4% of the prediction in MEO orbit and 16.9% of the prediction in IGSO orbit based on the CREME96 model, and the SEU rates of the two orbits are equivalent. During the solar flare eruption, the SEU rates of the configuration memory of FPGA in MEO and IGSO rise to 2.5 upsets/(device·d) and 5 upsets/(device·d) respectively. The SEU rate can provide an effective reference for the prediction of SEU rate of the satellite electronic equipment in the same orbit.

Key words: XQR2V3000, Configuration memory, SEU rate, Detection